Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistors

CHEE-WEE LIUSun, H.-C.H.-C.SunHuang, C.-F.C.-F.HuangChen, Y.-T.Y.-T.ChenWu, T.-Y.T.-Y.WuLiu, C.W.C.W.LiuHsu, Y.-J.Y.-J.HsuChen, J.-S.J.-S.ChenCHEE-WEE LIU2018-09-102018-09-102010http://www.scopus.com/inward/record.url?eid=2-s2.0-78049303984&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/358240Threshold voltage and mobility extraction of NBTI degradation of poly-Si thin-film transistorsjournal article10.1109/TED.2010.2068550