Tetragonal distortion of InAsPSb film grown on InAs substrate studied by Rutherford backscattering/channeling and synchrotron X-ray diffraction

F. ChengT. FaS. YaoC. J. WuH. H. LinZ. C. FengHAO-HSIUNG LIN2018-09-102018-09-102011-09http://scholars.lib.ntu.edu.tw/handle/123456789/366269Tetragonal distortion of InAsPSb film grown on InAs substrate studied by Rutherford backscattering/channeling and synchrotron X-ray diffractionjournal article10.1016/j.physb.2011.05.0272-s2.0-79959331329WOS:000293030100019