An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on Belief Propagation

AN-YEU(ANDY) WURao, H.H.RaoChen, J.J.ChenZhao, V.H.V.H.ZhaoAng, W.T.W.T.AngWey, I.-C.I.-C.WeyAN-YEU(ANDY) WU2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-51749118706&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/341342An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on Belief Propagationconference paper10.1109/ISCAS.2008.4541491