Chou W.-C.CHIA-PIN CHIOLiao C.-M.2022-03-252022-03-2520090304-3894https://www.scopus.com/inward/record.uri?eid=2-s2.0-67649295031&doi=10.1016%2fj.jhazmat.2009.01.079&partnerID=40&md5=cf41f1792284fac5f07a8961f5f27f8fhttps://scholars.lib.ntu.edu.tw/handle/123456789/602146Assessing airborne PM-bound arsenic exposure risk in semiconductor manufacturing facilitiesjournal article10.1016/j.jhazmat.2009.01.079192335572-s2.0-67649295031