A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications

Iorga, C.C.IorgaLu, Yi-ChangYi-ChangLuDutton, R.W.R.W.Dutton2011-10-172018-07-102011-10-172018-07-102007http://ntur.lib.ntu.edu.tw//handle/246246/237232en-USA built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applicationsjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/237232/-1/03.pdf