Hwu, Jenn-GwoJenn-GwoHwuLee, Si-ChenSi-ChenLeeWang, Way-SeenWay-SeenWang2009-04-272018-07-062009-04-272018-07-061987http://ntur.lib.ntu.edu.tw//handle/246246/153963en-USStudies of the Radiation-Hardening CMOS Processesreport