Hu Y.C.Wan S.W.C. ROBERT KAO2019-11-272019-11-272002078037682X9780780376823https://www.scopus.com/inward/record.uri?eid=2-s2.0-84966605187&doi=10.1109%2fEMAP.2002.1188883&partnerID=40&md5=4bf87024f09f264e22023c32f4975455https://scholars.lib.ntu.edu.tw/handle/123456789/432732Electromigration in tin thin filmconference paper10.1109/EMAP.2002.11888832-s2.0-84966605187