Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FET

M.-L. FanV. P.-H. HuY.-N. ChenP. SuC.-T. ChuangVITA PI-HO HUM.-L. FanV. P.-H. HuY.-N. ChenP. SuC.-T. Chuang胡璧合2020-10-072020-10-072013https://scholars.lib.ntu.edu.tw/handle/123456789/516599Analysis of Single-Trap-Induced Random Telegraph Noise and its Interaction With Work Function Variation for Tunnel FETjournal article10.1109/ted.2013.22581572-s2.0-84878138155