Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits,

CHIEN-MO LIC.Y. KuoC. J. ShihJ. C. M. LiK. ChakrabartyCHIEN-MO LI2018-09-102018-09-102012-01http://scholars.lib.ntu.edu.tw/handle/123456789/374350Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits,conference paper