HSIN-CHIA LUTAH HSIUNG CHU2009-03-112018-07-062009-03-112018-07-06199900189480http://ntur.lib.ntu.edu.tw//handle/246246/144052http://ntur.lib.ntu.edu.tw/bitstream/246246/144052/1/02.pdfhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-0032803621&doi=10.1109%2f22.740082&partnerID=40&md5=b0a7eadcb1e7a0a72006bd08198d2d59A microwave diversity imaging system conventionally uses a vector network analyzer (VNA) to directly measure the object scattered field (amplitude and phase) over a selected frequency range and viewing angles, then reconstructs the scattering object characteristic function through two-dimensional Fourier inversion. In this paper, we present a cost-effective microwave diversity imaging system using a six-port reflectometer, which measures four amplitude (or power) values to acquire the object scattered field indirectly. One can then eliminate the coherent detectors in a VNA. The calibration procedure for this microwave diversity imaging measurement is also described. Experimental results of three types of scattering objects, a metallic cylinder, four distributed line scatterers, and a 72:1 scaled B-52 aircraft model, are presented using the described six-port microwave imaging system. © 1999 IEEE.application/pdf177651 bytesapplication/pdfen-USMicrowave diversity imaging; Six-port reflectometerCalibration; Electromagnetic wave scattering; Fourier transforms; Imaging systems; Microwave devices; Microwave diversity imaging; Reflectometersjournal article10.1109/22.7400822-s2.0-0032803621http://ntur.lib.ntu.edu.tw/bitstream/246246/144052/1/02.pdf