國立臺灣大學電機工程學系暨研究所詹國禎2006-07-252018-07-062006-07-252018-07-062003-10-31http://ntur.lib.ntu.edu.tw//handle/246246/7927本計畫以螢光光譜、調制光譜以及雷射激發之螢光顯微量測系統，進行奈米結構的材 料與元件的光學性質研究。奈米結構以掃瞄式探針顯微術描繪其型態尺寸及分佈，並以螢 光光譜及光調制反射率光譜進行電子能態的光躍遷能值量測。使用螢光或調制顯微影像 術，配合非接觸式、非侵入式的光學量測，對於化學或生物奈米結構的光學性質與高空間 解析的微影像技術，提供極有用的物理、生化及生物機制的信息，將能夠發展成具有應用 潛力的診斷工具。In this study, we develop micro-imaging techniques such as confocal microscopy and differential confocal microscopy systems combining with photoluminescence (PL) and photoreflectance (PR) spectroscopic systems. These techniques are used to study the optical properties of the nano-structure materials and devices such as InAs/GaAs quantum dots (QDs) and biological nano-structure specimens. We employ the scanning probe microscope (SPM) to observe the morphologic structures of the nano-structure devices’ surface, and to measure the size, shape and distribution. The results provide important information about physical, chemical and biological mechanism, and it would extend the potential applications on biological field of these powerful diagnostic tools.application/pdf334105 bytesapplication/pdfzh-TW國立臺灣大學電機工程學系暨研究所螢光光譜光調制反射率光譜奈米結構螢光顯微影像共焦顯微術photoluminescencephotoreflectancenano-structurePL-microspectroscopyconfocal microscopyreporthttp://ntur.lib.ntu.edu.tw/bitstream/246246/7927/1/912213E002085.pdf