Lee, P. H.P. H.LeeChang, C. C.C. C.Chang2010-09-202018-07-102010-09-202018-07-102007-01http://ntur.lib.ntu.edu.tw//handle/246246/204795en-USSpectroscopic Characterization of Nickel Films on Sub-10-nm Silica Layers: Thermal Metamorphosis and Chemical Bondingjournal article