Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and 'just noticeable difference' quantification strategies

Chen, L.-C.L.-C.ChenKuo, C.-C.C.-C.KuoLIANG-CHIA CHEN2020-01-132020-01-132008https://scholars.lib.ntu.edu.tw/handle/123456789/447882Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and 'just noticeable difference' quantification strategiesjournal article10.1088/0957-0233/19/1/0155072-s2.0-38849172631https://www.scopus.com/inward/record.uri?eid=2-s2.0-38849172631&doi=10.1088%2f0957-0233%2f19%2f1%2f015507&partnerID=40&md5=aad0e200a124467d36697e91874d31b4