JIUN-LANG HUANGCheng, K.-T.K.-T.Cheng2020-06-112020-06-112000https://www.scopus.com/inward/record.uri?eid=2-s2.0-84884688387&doi=10.1145%2f368434.368830&partnerID=40&md5=6527a089bbcc555beb9a534c4459b3adIn this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits. © 2000 IEEE.Accurate measurement; Analog circuitry; Builtin self-test (BIST); High quality; Mixed-signal circuits; On chips; Response analysis; Sigma-Delta modulation; Built-in self test; Computer aided design; Delta sigma modulation; Analog circuitsconference paper10.1145/368434.3688302-s2.0-84884688387