孫啟光臺灣大學：光電工程學研究所陳政吉Chen, Cheng-ChiCheng-ChiChen2007-11-252018-07-052007-11-252018-07-052004http://ntur.lib.ntu.edu.tw//handle/246246/50844在本論文中，我們利用共焦顯微鏡來量測不同厚度下具包夾層的氧化銀奈米結構薄膜賑薑虪In this thesis, we study of optical characteristics of AgOx nanostructure thin films with different thickness on the glass substrate using confocal laser scanning microscope and use surface plasmon properties to explain all the optical phenomenon of confocal images. Finally, we demonstrate successfully that the strong evanescence field resulting from surface plasmon resonance of AgOx nanostructure thin films will enhance the lateral resolution of the confocal microscope in the near field. Also, we observe that surface plasmon resonance will interrupt by objects in the near field.目錄 中文摘要 Ⅰ 英文摘要 Ⅱ 致謝 Ⅲ 目錄 Ⅳ 圖目錄 Ⅶ 表目錄 Ⅹ 第一章 緒論 1 1.0 前言 1 1.1 研究動機 2 1.2 近場光學簡介與近場記錄的發展 210081183 bytesapplication/pdfen-US共焦顯微鏡超解析結構表面電漿子共振SPRsurface plasmon resonancesuper-resolution near-field structureconfocal microscopeconfocal laser scanning microscopeSuper-RENSCLSMthesishttp://ntur.lib.ntu.edu.tw/bitstream/246246/50844/1/ntu-93-R91941018-1.pdf