馮武雄Chan, T. Y.T. Y.ChanHu, C.C.HuFeng, Wu-ShiungWu-ShiungFeng2009-02-042018-07-062009-02-042018-07-061986-10http://ntur.lib.ntu.edu.tw//handle/246246/120744en-USMOSFET Drain Breakdown Voltagejournal article