Hartmann A.J.Lamb R.N.Scott J.F.Johnston P.N.El Bouanani M.Chen C.W.Robertson J.CHUN-WEI CHEN2019-11-272019-11-27199803744884https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032396464&partnerID=40&md5=b54066e00f3f5825ac56605aaafa8d91https://scholars.lib.ntu.edu.tw/handle/123456789/432889Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin filmsjournal article2-s2.0-0032396464