Correlation of Electrical, Thermal and Structural Properties of Microcrystalline Silicon Thin Films

D. DasM. JanaA. K. BaruaS. ChattopadhyayL. C. ChenK. H. Chen2020-06-202020-06-20200200214922https://iopscience.iop.org/article/10.1143/JJAP.41.L229https://scholars.lib.ntu.edu.tw/handle/123456789/503916Correlation of Electrical, Thermal and Structural Properties of Microcrystalline Silicon Thin Filmsjournal article10.1143/JJAP.41.L229