Phase and microstructural evolution during the interaction between bismuth oxide films and Pt/Ti/SiO2/Si substrates

Wen, C. Y.C. Y.WenLu, C. H.C. H.LuCHENG-YEN WEN2020-05-122020-05-1219990731-5171https://scholars.lib.ntu.edu.tw/handle/123456789/491142Phase and microstructural evolution during the interaction between bismuth oxide films and Pt/Ti/SiO2/Si substratesjournal article10.1080/07315179908241298WOS:000084389500004