On-wafer 2D electric-field-vector mapping using one-beam electro-optic probing technique

Chen, W.H.W.H.ChenKuo, W.K.W.K.KuoHuang, S.L.S.L.HuangHuang, Y.T.Y.T.HuangCheng, H.Z.H.Z.ChengSHENG-LUNG HUANG2018-09-102018-09-102000http://www.scopus.com/inward/record.url?eid=2-s2.0-0034543157&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/289872On-wafer 2D electric-field-vector mapping using one-beam electro-optic probing techniqueconference paper