The study of microstructure evolution of tin grains due to electromigration by using synchrotron X-ray microdiffraction

Wu, A. T.A. T.WuTu, K. N.K. N.TuLloyd, J. R.J. R.LloydTamura, N.N.TamuraValek, B. C.B. C.ValekKao, and C. R.and C. R.Kao2010-09-032018-06-282010-09-032018-06-282004-09http://ntur.lib.ntu.edu.tw//handle/246246/198768en-USThe study of microstructure evolution of tin grains due to electromigration by using synchrotron X-ray microdiffractionjournal article