In-situ XPS, STM and STS analyses of high k oxide/III-V interfaces

Huang, Mao-LinMao-LinHuangChang, Yu-ShingYu-ShingChangChang, PenPenChangChiu, Han-ChinHan-ChinChiuShen, Jyun-YangJyun-YangShenLin, Tsung-DaTsung-DaLinRaynien Kwo, JJRaynien KwoMINGHWEI HONGPi, Tun-WenTun-WenPi2018-09-102018-09-102010http://scholars.lib.ntu.edu.tw/handle/123456789/357448In-situ XPS, STM and STS analyses of high k oxide/III-V interfacesconference paper