Kuan-Hsien HoJie-Hong R. JiangYAO-WEN CHANGJIE-HONG JIANG2018-09-102018-09-102010-01http://scholars.lib.ntu.edu.tw/handle/123456789/359599Due to the increasing IC design complexity, Engineering Change Orders (ECOs) have become a necessary technique to resolve late-found functional and/or timing deficiencies. To fix timing violations, the principles of gate sizing and buffer insertion are commonly used in post-mask ECO. These techniques however may not be powerful enough, especially when spare cells are inserted in a way of striking a balance between functional and timing repair capabilities. We propose a post-mask ECO technique, called TRECO, to remedy timing violations based on technology remapping, which supports functional ECO as well. Unlike conventional technology mapping, TRECO performs technology mapping with respect to a limited set of spare cells and confronts dynamic changes of wiring cost incurred by different spare-cell selections. With a pre-computed lookup table of representative circuit templates, TRECO iteratively performs technology remapping to restructure timing critical sub-circuits until no timing violation remains. Experimental results on five industrial designs show the effectiveness of TRECO in ECO timing optimization.[SDGs]SDG16Buffer insertion; Cell selection; Conventional technology; Dynamic changes; Dynamic technologies; Engineering change orders; Gate sizing; IC designs; Industrial design; Look up table; Remapping; Sub-circuits; Technology mapping; Timing optimization; Computer aided design; Crime; Digital integrated circuits; Gates (transistor); Optical devices; Table lookup; Technology; Time measurement; Timing circuitsconference paper10.1109/ASPDAC.2010.54198742-s2.0-77951240347WOS:000310330300008