Sun, Chi-KuangChi-KuangSunChu, S.-W.S.-W.ChuTai, S.-P.S.-P.TaiKeller, S.S.KellerMishra, U.K.U.K.MishraDenBaars, S.P.S.P.DenBaars2018-09-102018-09-10200000036951http://www.scopus.com/inward/record.url?eid=2-s2.0-0000751158&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/289835https://www.scopus.com/inward/record.uri?eid=2-s2.0-0000751158&doi=10.1063%2f1.1316776&partnerID=40&md5=3e352a198fcb5551092cf3bb4d548edfScanning second-harmonic generation and third-harmonic generation microscopy of a gallium nitride (GaN) sample was demonstrated using a femtosecond Cr:forsterite laser. Taking advantage of the electric-field enhanced second-harmonic generation effect and bandtail state resonance effect, the obtained second-harmonic and third-harmonic generation microscopic images revealed the piezoelectric field and bandtail state distributions in a GaN sample. © 2000 American Institute of Physics.application/pdfapplication/pdfjournal article2-s2.0-0000751158