Relationship between mobile charges and interface trap states in silicon mos capacitors

Hwu, J.-G.J.-G.HwuWang, W.-S.W.-S.WangChiou, Y.-L.Y.-L.ChiouJENN-GWO HWU2018-09-102018-09-101986http://www.scopus.com/inward/record.url?eid=2-s2.0-0022678320&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/321884Relationship between mobile charges and interface trap states in silicon mos capacitorsjournal article10.1080/02533839.1986.9676875