Su, CCCCSuChang, CSCSChangHuang, HWHWHuangTu, DSDSTuLee, C-LC-LLeeLin, Jerry CHJerry CHLinCHIA-LIN LEE2018-09-102018-09-102004http://scholars.lib.ntu.edu.tw/handle/123456789/307875Dynamic analog testing via ATE digital test channelsconference paper