Parallel order ATPG for test compaction

Chen, Y.-W.Y.-W.ChenHo, Y.-H.Y.-H.HoChang, C.-M.C.-M.ChangYang, K.-C.K.-C.YangLi, M.-T.M.-T.LiCHIEN-MO LI2020-06-292020-06-292018https://scholars.lib.ntu.edu.tw/handle/123456789/505985Parallel order ATPG for test compactionconference paper10.1109/VLSI-DAT.2018.83732642-s2.0-85049341151https://www.scopus.com/inward/record.uri?eid=2-s2.0-85049341151&doi=10.1109%2fVLSI-DAT.2018.8373264&partnerID=40&md5=71640616841aa0fa2253fbd93edcc130