RUEY-SHAN GUO2018-09-102018-09-101998-06http://scholars.lib.ntu.edu.tw/handle/123456789/343378Among the various statistical process control (SPC) charts, the Shewhart chart (Shewhart, Economic Control of Quality Improvement, Van Nostrand Reinhold, 1931) has been the most used control chart in practice due to its simplicity and explicit representation. In many practical situations, there are two or more related quality characteristics that must be monitored simultaneously. The Shewhart chart used at present is inefficient for monitoring multiple variables and lacks the capability to consider the relationships between variables. In this paper, we develop runs rules for the Shewhart chart to control bivariate data. The results show that the Shewhart chart with runs rules is comparable, and in some cases superior, to the T/sup 2/ control chart. We use the thickness data of an SiO/sub 2/ layer as an example to illustrate the methodology.[SDGs]SDG9conference paper10.1109/iwstm.1998.7297872-s2.0-0032275917