Dept. of Electr. Eng., National Taiwan Univ.Huang, Chin-YuChin-YuHuangKuo, Sy-YenSy-YenKuoChen, Ing-YiIng-YiChen2007-04-192018-07-062007-04-192018-07-061997-11http://ntur.lib.ntu.edu.tw//handle/246246/2007041910031920application/pdf818905 bytesapplication/pdfen-USAnalysis of a software reliability growth model with logistic testing-effort functionjournal article10.1109/ISSRE.1997.630886http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910031920/1/00630886.pdf