Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysis

Chen, ArgonArgonChenHong, AmosAmosHong2012-10-312018-06-282012-10-312018-06-282010http://ntur.lib.ntu.edu.tw//handle/246246/244272en-USSample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysisjournal article10.1109/TSM.2010.2048968http://ntur.lib.ntu.edu.tw/bitstream/246246/244272/-1/363.pdf