Characterization of 1/f noise vs. number of gate stripes in MOS transistors.

Chen, Hsin-ShuHsin-ShuChenIto, A.A.ItoHSIN-SHU CHEN2020-06-112020-06-111999https://scholars.lib.ntu.edu.tw/handle/123456789/501235Characterization of 1/f noise vs. number of gate stripes in MOS transistors.conference paper10.1109/ISCAS.1999.780720https://doi.org/10.1109/ISCAS.1999.780720