Threading dislocation induced low frequency noise in strained-Si nMOSFETs

CHEE-WEE LIUHua, W.-C.W.-C.HuaLee, M.H.M.H.LeeChen, P.S.P.S.ChenTsai, M.-J.M.-J.TsaiCHEE-WEE LIU2018-09-102018-09-102005http://www.scopus.com/inward/record.url?eid=2-s2.0-26444520423&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/316572[SDGs]SDG7Threading dislocation induced low frequency noise in strained-Si nMOSFETsjournal article10.1109/LED.2005.853672