Laung-Terng WangCheng-Wen WuXiaoqing WenKhader S. Abdel-HafezWen-Ben JoneRohit KapurBrion KellerKuen-Jong LeeCHIEN-MO LIMike Peng LiXiaowei LiT.M. MakYinghua MinBenoit Nadeau-DostieSoumendu BhattacharyaMehrdad NouraniJanusz RajskiCharles StroudErik H. VolkerinkDuncan M. (Hank) WalkerShianling WuNur A. ToubaAbhijit ChatterjeeXinghao ChenKwang-Ting (Tim) ChengWilliam EklowMichael S. HsiaoJiun-Lang HuangShi-Yu Huang2018-09-102018-09-102006-019780123705976http://scholars.lib.ntu.edu.tw/handle/123456789/325777VLSI Test Principles and Architecturesbook