Applications of damage models to durability investigations for electronic connectors

KUO-CHI LIAOChang, C.-C.C.-C.Chang2018-09-102018-09-102009http://www.scopus.com/inward/record.url?eid=2-s2.0-48549100418&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/347299application/pdf900462 bytesapplication/pdf[SDGs]SDG12Applications of damage models to durability investigations for electronic connectorsjournal article10.1016/j.matdes.2008.04.047