An Automated W-Band On-Wafer Noise Figure Measurement System

Chen, S.S.ChenYang, D.C.D.C.YangWang, H.H.WangHayashibara, K.K.HayashibaraGodshalk, E.M.E.M.GodshalkAllen, B.B.AllenHUEI WANG2020-06-042020-06-041993https://scholars.lib.ntu.edu.tw/handle/123456789/497419An Automated W-Band On-Wafer Noise Figure Measurement Systemconference paper10.1109/ARFTG.1993.3270192-s2.0-33746227059https://www.scopus.com/inward/record.uri?eid=2-s2.0-33746227059&doi=10.1109%2fARFTG.1993.327019&partnerID=40&md5=cd4617ee616f55100e3158d69efcbac7