The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruption

Chen, C.C.ChenZhang, J.J.ZhangRUEY-SHAN GUO2020-03-062020-03-062016https://scholars.lib.ntu.edu.tw/handle/123456789/471839The D-Day, V-Day, and bleak days of a disruptive technology: A new model for ex-ante evaluation of the timing of technology disruptionjournal article10.1016/j.ejor.2015.11.0232-s2.0-84960336412https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960336412&doi=10.1016%2fj.ejor.2015.11.023&partnerID=40&md5=f67ceaeb3d7254e347725bf67dcb5d16