Constant peak field distribution and voltage dropping in the oxide layer of a MOS capacitor during charge-temperature aging

JENN-GWO HWU2018-09-102018-09-101987http://www.scopus.com/inward/record.url?eid=2-s2.0-0023365768&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/329955Constant peak field distribution and voltage dropping in the oxide layer of a MOS capacitor during charge-temperature agingjournal article10.1080/00207218708921037