Chang, Y. M.Y. M.ChangMINN-TSONG LINPan, W.W.PanHo, C. H.C. H.HoYao, Y. D.Y. D.Yaode Haas, O.O.de HaasSchafer, R.R.SchaferSchneider, F. C. M.F. C. M.Schneider2018-09-102018-09-10200203048853http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000175187300115&KeyUID=WOS:000175187300115http://scholars.lib.ntu.edu.tw/handle/123456789/297650https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036465345&doi=10.1016%2fS0304-8853%2801%2900670-9&partnerID=40&md5=47b4dd950a0e94309b7577eabc51dbd8A discussion on magnetic domain imaging of exchange bias system NiO/Cu/NiFe was presented by Kerr microscopy. Two types of magnetic domain structures with different Cu thickness were observed by Kerr microscopy for the NiO/Cu/NiFe system. The results showed a frozen-in magnetic structure coinciding with domain wall at room temperature at Cu = 8 Å. The domain images expanded with frustrated domain wall instead at Cu = 2 Å.Exchange bias; Kerr microscopy; Magnetic domainAntiferromagnetic materials; Ferromagnetic materials; Imaging techniques; Magnetic anisotropy; Magnetron sputtering; Microscopic examination; Nickel compounds; Nucleation; Optical Kerr effect; Kerr microscopy; Magnetic domainsjournal article10.1016/s0304-8853(01)00670-92-s2.0-0036465345WOS:000175187300115