Screening of remote charge scattering sites from the oxide/silicon interface of strained two-dimensional electron gases by an intermediate tunable shielding electron layer

C. T. HuangJIUN-YUN LIK. S. ChouJ. C. Sturm2019-10-242019-10-24201436951https://scholars.lib.ntu.edu.tw/handle/123456789/428001Screening of remote charge scattering sites from the oxide/silicon interface of strained two-dimensional electron gases by an intermediate tunable shielding electron layerjournal article10.1063/1.48846502-s2.0-84903191585