Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation

Chang-Liao, K.-S.K.-S.Chang-LiaoHwu, J.-G.J.-G.HwuJENN-GWO HWU2018-09-102018-09-101992http://www.scopus.com/inward/record.url?eid=2-s2.0-0026881848&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/296941Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiationjournal article