Chang, H.-Y.H.-Y.ChangChang, C.-L.C.-L.ChangHUI-RU JIANG2020-06-112020-06-112012https://www.scopus.com/inward/record.uri?eid=2-s2.0-84859003368&doi=10.1109%2fTVLSI.2011.2116049&partnerID=40&md5=acac2345dc699ba0fa0f896ce2393b8dDue to excessive current densities, electromigration (EM) may trigger a permanent open- or short-circuit failure in signal wires or power networks in analog or mixed-signal circuits. As the feature size keeps shrinking, this effect becomes a key reliability concern. Hence, in this paper, we focus on wiring topology generation for avoiding EM at the routing stage. Prior works tended towards heuristics; on the contrary, we first claim this problem belongs to class P instead of class NP-hard. Our breakthrough is, via the proof of the greedy-choice property, we successfully model this problem on a multi-source multi-sink flow network and then solve it by a strongly polynomial time algorithm. Experimental results prove the effectiveness and efficiency of our algorithm. © 2006 IEEE.Algorithms; electromigration (EM); global routing; integrated circuit reliability; linear programmingconference paper10.1109/TVLSI.2011.21160492-s2.0-84859003368