Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors

CHEE-WEE LIUHuang, C.-F.C.-F.HuangSun, H.-C.H.-C.SunKuo, P.-S.P.-S.KuoChen, Y.-T.Y.-T.ChenLiu, C.W.C.W.LiuHsu, Y.-J.Y.-J.HsuChen, J.-S.J.-S.ChenCHEE-WEE LIU2018-09-102018-09-102009http://www.scopus.com/inward/record.url?eid=2-s2.0-71049150151&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/350489Dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistorsconference paper10.1109/IPFA.2009.5232678