Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Properties

H.-S. LiaoB.-J. JuangW.-C. ChangW.-C. LaiK.-Y. HuangC.-S. ChangHSIEN-SHUN LIAO2021-12-022021-12-022011https://scholars.lib.ntu.edu.tw/handle/123456789/589480https://www.scopus.com/inward/record.uri?eid=2-s2.0-82555173680&doi=10.1063%2f1.3664617&partnerID=40&md5=5ebdd5e2915f673e730cd7e1da693285Rotational Positioning System Adapted to Atomic Force Microscope for Measuring Anisotropic Surface Propertiesjournal article10.1063/1.36646172-s2.0-82555173680