Scanning electron beam induced deposition for conductive tip modification.

Chen, P. L.P. L.ChenSu, JamesJamesSuShiao, M. H.M. H.ShiaoChang, M. N.M. N.ChangLee, C. H.C. H.LeeCHIH-WEN LIUCHEE-WEE LIU2020-06-162020-06-162012https://scholars.lib.ntu.edu.tw/handle/123456789/502121Scanning electron beam induced deposition for conductive tip modification.conference paper10.1109/NEMS.2012.6196836https://doi.org/10.1109/NEMS.2012.6196836