Chuang, T.-H.T.-H.ChuangTsai, M.-W.M.-W.TsaiChang, Y.-T.Y.-T.ChangSI-CHEN LEE2020-06-112020-06-11200600036951https://scholars.lib.ntu.edu.tw/handle/123456789/498765https://www.scopus.com/inward/record.uri?eid=2-s2.0-33746417967&doi=10.1063%2f1.2234290&partnerID=40&md5=e4057305ddba6f6d695b158de6aa8b19The zero-order transmission of radiation through a metal/dielectric structure perforated with square hole arrays is strongly enhanced when incident light resonates with surface plasmons (SPs). Surprisingly, when a metal/dielectric double layer, such as Ag/SiO2, is fabricated on a silicon substrate, the Ag/Si SP mode by coupling Ag and Si across the intermediate dielectric film has been found. It is named the remotely coupled surface plasmon. The transmission intensity is investigated as a function of the intermediate SiO2 thickness. The coupling lengths between Ag and Si in order to form the Ag/Si SP mode are determined as well, and they turn out to be 500 and 130 nm for couplings through air and a SiO2 layer, respectively. © 2006 American Institute of Physics.Dielectric materials; Optical resonators; Silicon; Silver; Coupling lengths; Metal/dielectric double layers; Silicon substrates; Transmission intensity; Surface plasmon resonancejournal article10.1063/1.22342902-s2.0-33746417967