Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM

CHIEN-MO LIBC BaiC-L HsuMH WuCA ChenYW ChenKL LuoLC ChengCHIEN-MO LI2018-09-102018-09-102013-01http://scholars.lib.ntu.edu.tw/handle/123456789/381717Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAMconference paper10.1109/ATS.2013.322-s2.0-84893494261