Huang, Chi-YuanChi-YuanHuangLin, Kai-WeiKai-WeiLinChen, Yaow-MingYaow-MingChen2025-11-212025-11-212025-10-2826879735https://www.scopus.com/record/display.uri?eid=2-s2.0-105020475384&origin=resultslisthttps://scholars.lib.ntu.edu.tw/handle/123456789/733923This paper presents a novel variable pre-charge compensation (VPC) technique integrated with a scalable double pulse test (DPT) system to enhance the accuracy of switching loss measurements. The conventional DPT setup could underestimate switching losses due to voltage drops and non-ideal components in the test circuit. To address this issue, the proposed VPC method compensates for these inaccuracies by pre-charging the bulk capacitor, ensuring accurate voltage and current conditions during switching events. Additionally, a modular DC power supply design with a simple communication mechanism is introduced, providing the flexibility needed for various test conditions. Prototypes of both the DPT platform and modular power supply were developed and tested. Experimental results demonstrate that the proposed VPC technique effectively eliminates measurement inaccuracy, achieving up to a 55.1% correction in switching loss compared to conventional DPT methods.falseDouble Pulse Test (DPT)modular power supplypower semiconductor devicesswitching loss[SDGs]SDG7journal article10.1109/jestie.2025.36265292-s2.0-105020475384