Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides

胡振國Lee, K. C.K. C.LeeHwu, Jenn-GwoJenn-GwoHwu2009-04-272018-07-062009-04-272018-07-061995http://ntur.lib.ntu.edu.tw//handle/246246/153942en-USRadiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxidesreport