Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors

CHEE-WEE LIUHuang, C.-F.C.-F.HuangYang, Y.-J.Y.-J.YangPeng, C.-Y.C.-Y.PengSun, H.-C.H.-C.SunLiu, C.W.C.W.LiuChao, C.-W.C.-W.ChaoLin, K.-C.K.-C.LinCHEE-WEE LIU2018-09-102018-09-102007http://www.scopus.com/inward/record.url?eid=2-s2.0-44949116082&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/332395[SDGs]SDG7Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistorsconference paper10.1109/ISDRS.2007.4422557