Investigation of reliability characteristics in NMOS and PMOS FinFETs

CHEE-WEE LIULiao, W.-S.W.-S.LiaoLiaw, Y.-G.Y.-G.LiawTang, M.-C.M.-C.TangChakraborty, S.S.ChakrabortyCHEE-WEE LIU2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-47249154866&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/341153Investigation of reliability characteristics in NMOS and PMOS FinFETsjournal article10.1109/LED.2008.2000723